Article
Direct imaging of electron density with a scanning transmission electron microscope - Nature Communications
Rating:
0.0
Views:
55
Likes:
1
Library:
1
Recent studies of secondary electron (SE) emission in scanning transmission electron microscopes suggest that material's properties such as electrical conductivity, connectivity, and work function can be probed with atomic scale resolution using a technique known as secondary electron e-beam-induced current (SEEBIC). Here, we apply the SEEBIC imaging technique to a stacked 2D heterostructure device to reveal the spatially resolved electron density of an encapsulated WSe2 layer. We
Rate This Post
Rate The Educational Value
Rate The Ease of Understanding and Presentation
Interesting or Boring? Rate the Entertainment Value