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SRAM-Based PUF Readouts - Scientific Data
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Large-scale parameter characterization of Physical Unclonable Functions (PUFs) is of paramount importance in order to assess the quality and thus the suitability of such PUFs which would then be developed as an industrial-grade solution for hardware root of trust. Carrying out a proper characterization requires a large number of devices that need to be repeatedly sampled at various conditions. These prerequisites make PUF characterization process a very time-consuming and expensive task.
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