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An investigation of the influence of microstructure surface topography on the imaging mechanism to explore super-resolution microstructure - Scientific Reports
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Vision-based precision measurement is limited by the optical resolution. Although various super-resolution algorithms have been developed, measurement precision and accuracy are difficult to guarantee. To achieve nanoscale resolution measurement, a super-resolution microstructure concept is proposed which is based on the idea of a strong mathematical mapping relationship that may exist between microstructure surface topography features and the corresponding image pixel intensities.
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