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Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy - Scientific Reports

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Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy - Scientific Reports

Application of scanning transmission electron microscopy (STEM) to in situ observation will be essential in the current and emerging data-driven materials science by taking STEM's high affinity with various analytical options into account. As is well known, STEM's image acquisition time needs to be further shortened to capture a targeted phenomenon in real-time as STEM's current temporal resolution is far below the conventional TEM's.

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Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy - Scientific Reports

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Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy - Scientific Reports

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